Showing results: 16 - 30 of 405 items found.
-
Renishaw Inc.
A range of fixed and manually adjustable heads that connect a touch-trigger probe to the machine quill, allowing flexible inspection of complex components.
-
MPI Advanced Semiconductor Test
Addressing the RF and High Power communication devices and discrete passive components production test market requirements, MPI introduced the TS2500 200 mm fully automatic probe system series. The system is based on industry leading production equipment from the Photonics Automation Division and incorporates decades of experience in RF and High Power measurement techniques from the MPI’s Advanced Semiconductor Test (AST) Division in combination with other AST products such as RF Probes, related calibration technology, and High Power accessories.
-
MPI Advanced Semiconductor Test
MPI high power probing solutions offer variety of probing systems which include manual, automated and fully-automated versions to provide solution for different budgets and specific requirements.
-
atg Luther & Maelzer
They provide flexible measurement technologies like Kelvin and high voltage tests in combination with low tooling costs. atg Luther & Maelzer offers a wide range of different systems starting from standard systems with 8 heads up to oversized systems with 24 test heads.
-
OHT Inc.
*This system can measure MRAM characteristics automatically.*Generates strong and constant magnetic fields. (Max 1.5T, the highest in the industry)*Performs high speed sweep of magnetic field by using non-magnetic materials wafer chuck. (Max 4Hz, ±1T, the highest in the industry)
-
Anfatec Instruments AG
This single point Kelvin Probe System operates under ambient conditions and is small enough to be placed in a customized glowth box. The probe head operates with an oscillating membrane and can be easily exchanged. The preamplifier is integrated inside the probe head.
-
Hatteras -
Del Mar Photonics, Inc.
The Hatteras is first professional system on the market for ultra fast transient absorption pump - probe spectroscopy. Two linear image sensors (multichannel detection) or two photodiodes (singlechannel detection) are placed behind an imaging spectrometer to measure probe and reference pulses, originating from a femtosecond white light (continuum) generator or from an optical parametric amplifier.
-
LCS- 4000 Series -
MicroXact, Inc.
The LCS-4000 Probe Station with Integrated Laser Cutting System gives the user maximum flexibility in semiconductor diagnostic cutting, failure analysis, trimming, marking and topside layer removal. All of these functions can be performed on a microscopic level, all on this one system which provides a high level of performance that is remarkably easy to use.
-
LCD 2424 -
Korima, Inc.
The Model 2424 Semi-Automatic LCD Probe Station is designed especially for probing LCDs and other large substrates. Built on a steady and reliable anti-vibration table, the Model 2424 has powerfully built features that perform a number of specific tests required by all LCD/flat panel display manufacturers.
-
GRS500 -
Polar Instruments Inc
Designed to help troubleshoot complex boards when fixture based tools are not a viable solution, the GRS500 is designed to help you compare the characteristics of good and faulty PCBs, using nodal impedance test, and a "Videosection" technique which presents you with high resolution images of a good board for use in live video comparison with the board under test,
-
OHT Inc.
*This system can measure MRAM characteristics automatically.*Automatically initializes(resets) before and shorten the time of measurement by having a built in initializer.*Generates strong and constant magnetic fields. (Prober: Max 1.5T, Initializer: 2.7T (the highest in the industry)
-
90061-XH Series -
HITEC Sensor Solutions Inc.
This system is ideal for field measurement and data logging of forces between the tips of resistance spot welders. The system consists of a handheld sensor and portable readout/ data logger (PMAC 2000).
-
RG-100PV -
NAPSON Corp.
*Measurement system for thin film on substrate samples for multi-points measurement*Even pitch and random pitch for Max.1,000 points*2-D/3-D square mapping software for even pitch
-
WS-8800 -
NAPSON Corp.
*Measurement of resistivity, thickness, conductivity(P/N) and temperature*Tester self-test function, wide measuring range*Thickness, measurement position and temperature correction function for silicon resistivity*Number of cassette station can be changed by customers request*Host (CIM) communication and SMIF or FOUP compatible
-
GATS-3200 -
W.M. Hague Company
* Test individual packages or * Test Multi-image panels with Step&Repeat Function * single flying probe top using very high speed voice coil motor (VCM) technology * 50 - 100 tests per second ... high throughput * Dual Flying Probe Top for testing bump-to-bump nets * flying probe head allows testing of all nets including each power and ground point * 4-wire test capability